Semiconductor chips are usually packaged, and their internal structure or shape is the data source and judgment basis for detecting internal defects in semiconductor chips. XRay detection equipment is a perspective imaging device designed to utilize the strong penetrability of X-rays, which can reveal the internal structure or morphology of the illuminated object and effectively solve the problem of semiconductor chip defect detection.
Zhengye Technology focuses on innovative technology solutions for XRay detection equipment and has cooperated with well-known manufacturers in the global semiconductor industry to develop new automatic detection solutions, replacing imported standalone equipment and solving difficulties and pain points for the industry. If you have any difficulties in semiconductor chip testing, we can discuss them together.
Zhengye Technology was founded in 1997 and has been committed to the research and production of equipment. Currently, it has obtained more than 600 patents and has formulated or participated in nearly 30 technical standards. The equipment is exported overseas. The XRay detection equipment produced by Zhengye Technology is currently widely used in industries such as semiconductors, lithium-ion new energy, 3C consumer electronics, electronic component production, automobiles, and die-casting parts. If there is a need for X-ray product testing, please feel free to contact customer service at any time.
